Features: • Part Identification- K4E660812E-JC/L(3.3V, 8K Ref.)- K4E640812E-JC/L(3.3V, 4K Ref.)- K4E660812E-TC/L(3.3V, 8K Ref.)- K4E640812E-TC/L(3.3V, 4K Ref.)• Extended Data Out Mode operation• CAS-before-RAS refresh capability•RAS-only and Hidden refresh capability•...
K4E660812E: Features: • Part Identification- K4E660812E-JC/L(3.3V, 8K Ref.)- K4E640812E-JC/L(3.3V, 4K Ref.)- K4E660812E-TC/L(3.3V, 8K Ref.)- K4E640812E-TC/L(3.3V, 4K Ref.)• Extended Data Out Mode op...
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Features: Part Identification - K4E660411D-JC(5.0V, 8K Ref., SOJ) - K4E640411D-JC(5.0V, 4K Ref., S...
Features: • Part Identification- K4E660412D-JC/L(3.3V, 8K Ref., SOJ)- K4E640412D-JC/L(3.3V, ...
Features: • Part Identification- K4E660412E-JI/P(3.3V, 8K Ref., SOJ)- K4E640412E-JI/P(3.3V, ...
Parameter | Symbol | Rating | Units |
Voltage on any pin relative to VSS | VIN,VOUT | -0.5 to +4.6 | V |
Voltage on VCC supply relative to VSS | VCC | -0.5 to +4.6 | V |
Storage Temperature | Tstg | -55 to +150 | °C |
Power Dissipation | PD | 1 | W |
Short Circuit Output Current | IOS Address | 50 | mA |
* Permanent device damage may occur if "ABSOLUTE MAXIMUM RATINGS" are exceeded. Functional operation should be restricted to the conditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
This is a family of 8,388,608 x 8 bit Extended Data Out Mode CMOS DRAMs K4E660812E. Extended Data Out Mode offers high speed random access of memory cells within the same row. Refresh cycle(4K Ref. or 8K Ref.), access time (-45, -50 or -60), power consumption(Normal or Low power) are optional features of this family. All of this family have CAS-before-RAS refresh, RAS-only refresh and Hidden refresh capabilities. Furthermore, Self-refresh operation is available in L-version. This 8Mx8 EDO Mode DRAM family K4E660812E is fabricated using Samsung¢s advanced CMOS process to realize high band-width, low power consumption and high reliability.