Features: ` Advanced Process Technology`Key Parameters Optimized for Class-D Audio Amplifier Applications` Low RDSON for Improved Efficiency` Low Qg and Qsw for Better THD and Improved Efficiency` Low Qrr for Better THD and Lower EMI` 175 Operating Junction Temperature for Ruggedness` Repetitive A...
IRLU4343-701PbF: Features: ` Advanced Process Technology`Key Parameters Optimized for Class-D Audio Amplifier Applications` Low RDSON for Improved Efficiency` Low Qg and Qsw for Better THD and Improved Efficiency` L...
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Parameter | Max. | Units | |
VDS | Drain-to-Source Voltage | 55 | V |
VGS | Gate-to-Source Voltage | ±20 | |
ID @ TC = 25 | Continuous Drain Current, VGS @ 10V | 26 | A |
ID @ TC = 100 | Continuous Drain Current, VGS @ 10V | 19 | |
IDM | Pulsed Drain Current | 80 | |
PD @TC = 25 | Power Dissipation | 79 | W |
PD @TC = 100 | Power Dissipation | 39 | |
Linear Derating Factor | 0.53 | W/ | |
TJ TSTG |
Operating Junction and Storage Temperature Range |
-40 to + 175 | |
Clamping Pressure | N |
This Digital Audio HEXFET® IRLU4343-701PbF is specifically designed for Class-D audio amplifier applications. This MosFET IRLU4343-701PbF utilizes the latest processing techniques to achieve low on-resistance per silicon area. Furthermore, Gate charge, body-diode reverse recovery and internal Gate resistance are optimized to improve key Class-D audio amplifier performance factors such as efficiency, THD and EMI. Additional features of this MosFET IRLU4343-701PbF are 175 operating junction temperature and repetitive avalanche capability. These features combine to make this MosFET a highly efficient, robust and reliable device for Class-D audio amplifier applications.