Application·Small package (Dual type)·High voltage and high current : VCEO = −50V, IC = −150mA (max)·High hFE: hFE = 120~400·Excellent hFE linearity : hFE (IC = −0.1mA) / hFE (IC = −2mA) = 0.95 (typ.)Specifications Characteristic Symbol Rating Unit Collector-base...
HN1A01FE: Application·Small package (Dual type)·High voltage and high current : VCEO = −50V, IC = −150mA (max)·High hFE: hFE = 120~400·Excellent hFE linearity : hFE (IC = −0.1mA) / hFE (IC =...
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Transistors Bipolar (BJT) VCEO -50V IC -150mA HFE 120 - 400 200mW
Characteristic | Symbol | Rating | Unit |
Collector-base voltage | VCBO | -50 | V |
Collector-emitter voltage | VCEO | -50 | V |
Emitter-base voltage | VEBO | -5 | V |
Collector current | IC | -150 | mA |
Base current | IB | -30 | mA |
Collector power dissipation | PC* | 100 | mW |
Junction temperature | Tj | 150 | |
Storage temperature range | Tstg | −55~150 |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).