HMN1M8DVN

Features: ·Access time : 70, 85, 120, 150 ns·High-density design : 8Mbit Design·Battery internally isolated until power is applied·Industry-standard 40-pin 1,024K x 8 pinout·Unlimited write cycles·Data retention in the absence of VCC·10-years minimum data retention in absence of power·Automatic wr...

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HMN1M8DVN Picture
SeekIC No. : 004364736 Detail

HMN1M8DVN: Features: ·Access time : 70, 85, 120, 150 ns·High-density design : 8Mbit Design·Battery internally isolated until power is applied·Industry-standard 40-pin 1,024K x 8 pinout·Unlimited write cycles·D...

floor Price/Ceiling Price

Part Number:
HMN1M8DVN
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/6/11

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Product Details

Description



Features:

·Access time : 70, 85, 120, 150 ns
·High-density design : 8Mbit Design
·Battery internally isolated until power is applied
·Industry-standard 40-pin 1,024K x 8 pinout
·Unlimited write cycles
·Data retention in the absence of VCC
·10-years minimum data retention in absence of power
·Automatic write-protection during power-up/power-down cycles
·Data is automatically protected during power loss



Pinout

  Connection Diagram


Specifications

Parameter Symbol RATING CONDITIONS
DC voltage applied on VCC relative to VSS VR -0.5V to Vcc+0.5  
DC Voltage applied on any pin excluding VCC relative to VSS VT -0.3V to 4.6V VT VCC+0.3
Operating temperature Topr 0 to 70  
Storage temperature TSTG -65 to 150  
Storage temperature Storage temperature 260 For 10 second
NOTE: Permanent device damage may occur if Absolute Maximum Ratings are exceeded.
Functional operation should be restricted to the Recommended DC Operating Conditions detailed in this data sheet.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.



Description

The HMN1M8DVN Nonvolatile SRAM is a 8,388,608-bit static RAM organized as 1,048,576 bytes by 8 bits.

The HMN1M8DVN has a self-contained lithium energy source provide reliable non-volatility coupled with the unlimited write cycles of standard SRAM and integral control circuitry which constantly monitors the single 3.3V supply for an out-oftolerance condition. When such a condition occurs, the lithium energy source is automatically switched on to sustain the memory until after VCC returns valid and write protection is unconditionally enabled to prevent garbled data. In addition the SRAM is unconditionally write-protected to prevent an inadvertent write operation. At this time the integral energy source is switched on to sustain the memory until after VCC returns valid.

The HMN1M8DVN uses extremely low standby current CMOS SRAM's, coupled with small lithium coin cells to provide non-volatility without long write-cycle times and the write-cycle limitations associated with EEPROM.




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