HMN12816D

Features: · Access time : 70, 85, 120, 150ns· High-density design : 256KByte Design· Battery internally isolated until power is applied· Industry-standard 40-pin 128K x 16 pinout· Unlimited write cycles· Data retention in the absence of VCC· 10-years minimum data retention in absence of power· Aut...

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SeekIC No. : 004364729 Detail

HMN12816D: Features: · Access time : 70, 85, 120, 150ns· High-density design : 256KByte Design· Battery internally isolated until power is applied· Industry-standard 40-pin 128K x 16 pinout· Unlimited write cy...

floor Price/Ceiling Price

Part Number:
HMN12816D
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/21

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Product Details

Description



Features:

· Access time : 70, 85, 120, 150ns
· High-density design : 256KByte Design
· Battery internally isolated until power is applied
· Industry-standard 40-pin 128K x 16 pinout
· Unlimited write cycles
· Data retention in the absence of VCC
· 10-years minimum data retention in absence of power
· Automatic write-protection during power-up/power-down cycles
· Data is automatically protected during power loss
· Conventional SRAM operation; unlimited write cycles



Pinout

  Connection Diagram


Specifications

PARAMETER
SYMBOL
RATING
CONDITIONS
DC voltage applied on VCC relative to VSS
VCC
-0.3V to 7.0V
DC Voltage applied on any pin excluding VCC
relative to VSS
VT
-0.3V to 7.0V
VT VCC+0.3
Operating temperature
TOPR
0 to 70°C
Storage temperature
TSTG
-40°C to 70°C
Temperature under bias TBIAS -10°C to 70°C  
Soldering temperature
TSOLDER
260°C
For 10 second



Description

The HMN12816D 128K x 16 nonvolatile SRAM's are 2,097,152-bit fully static, nonvolatile SRAM's, organized as 131,072 words by 16 bits. Each NVSRAM has a self contained lithium energy source and control circuitry which constantly monitors Vcc for an out-of-tolerance condition. When such a condition occurs, the lithium energy source is automatically switched on and write protection is unconditionally enabled to prevent data corruption. DIP-package HMN12816D devices can be used in place of solutions which build nonvolatile 128Kx16 memory by utilizing a variety of discrete components. There is no limit on the number of write cycles that can be executed and no additional support circuitry is required for microprocessor interfacing.

The HMN12816D uses extremely low standby current CMOS SRAM's, coupled with small lithium coin cells to provide nonvolatility without long write-cycle times and the write-cycle limitations associated with EEPROM.




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