Features: · 3rd Generation· Enhancement−Mode· Low Saturation Voltage: VCE (sat) = 8 V (Max.) (@IC = 150 A)· 4.5 V Gate DriveSpecifications CHARACTERISTIC SYMBOL RATING UNIT Collector−Emitter Voltage VCES 400 V Gate−Emitter ...
GT8G103: Features: · 3rd Generation· Enhancement−Mode· Low Saturation Voltage: VCE (sat) = 8 V (Max.) (@IC = 150 A)· 4.5 V Gate DriveSpecifications CHARACTE...
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CHARACTERISTIC | SYMBOL | RATING | UNIT | |
Collector−Emitter Voltage | VCES | 400 | V | |
Gate−Emitter Voltage | DC | VGES | ±6 | V |
Pulse | VGES | ±8 | V | |
Collector Current | DC | IC | 8 | A |
1 ms | ICP | 150 | A | |
Collector Power Dissipation |
Ta = 25°C | PC | 1.3 | W |
Tc = 25°C | PC | 20 | W | |
Junction Temperature | Tj | 150 | ||
Storage Temperature Range | Tstg | −55~150 |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).