Features: • Third-generation IGBT• Enhancement mode type• High speed: tf = 0.32 s (max)• Low saturation voltage: VCE (sat) = 2.7 V (max)• FRD included between emitter and collectorSpecifications Characteristics Symbol Rating Unit Collector-emitte...
GT25Q301: Features: • Third-generation IGBT• Enhancement mode type• High speed: tf = 0.32 s (max)• Low saturation voltage: VCE (sat) = 2.7 V (max)• FRD included between emitter a...
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Characteristics |
Symbol |
Rating |
Unit | |
Collector-emitter voltage |
VCES |
1200 |
V | |
Gate-emitter voltage |
VEBS |
±20 |
V | |
Collector current |
DC |
IC |
25 |
A |
1 ms |
ICP |
50 | ||
Collector power dissipation |
DC |
IF |
25 |
mW |
1 ms |
IFP |
50 | ||
Collector power dissipation (Tc = 25°C) |
PC |
200 |
W | |
Junction temperature |
Tj |
150 |
||
Storage temperature range |
Tstg |
-55 to 150 |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).