Features: • Simultaneous Read and Write SigmaQuad™ Interface• JEDEC-standard pinout and package• Dual Double Data Rate interface• Byte Write controls sampled at data-in time• DLL circuitry for wide output data valid window and future frequency scaling• Bur...
GS8182S18D-250: Features: • Simultaneous Read and Write SigmaQuad™ Interface• JEDEC-standard pinout and package• Dual Double Data Rate interface• Byte Write controls sampled at data-in...
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Symbol | Description | Value | Unit |
VDD | Voltage on VDD Pins | 0.5 to 2.9 | V |
VDDQ | Voltage in VDDQ Pins | 0.5 to VDD | V |
VI/O | Voltage on I/O Pins | 0.5 to VDDQ +0.5 ( 2.9 V max.) | V |
VIN | Voltage on Other Input Pins | 0.5 to VDDQ +0.5 ( 2.9 V max.) | V |
IIN | Input Current on Any Pin | +/100 | mA dc |
IOUT | Output Current on Any I/O Pin | +/100 | mA dc |
TJ | Maximum Junction Temperature | 125 | °C |
TSTG | Storage Temperature | 55 to 125 | °C |
TSUB | Storage Under Bias | 50 to 100 | °C |
VREF | Voltage in VREF Pins | 0.5 to VDDQ | V |
Note:
Permanent damage to the device may occur if the Absolute Maximum Ratings are exceeded. Operation should be restricted to Recommended Operating Conditions. Exposure to conditions exceeding the Recommended Operating Conditions, for an extended period of time, may affect reliability of this component.
GS8182S18 are built in compliance with the SigmaSIO-II SRAM pinout standard for Separate I/O synchronous SRAMs. GS8182S18D-250 are 18,874,368-bit (18Mb) SRAMs. These are the first in a family of wide, very low voltage HSTL I/O SRAMs designed to operate at the speeds needed to implement economical high performance networking systems.