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GS8160EV18AT-350

Features: • FT pin for user-configurable flow through or pipeline operation • Dual Cycle Deselect (DCD) operation• 1.8 V +10%/10% core power supply• 1.8 V I/O supply•LBO pin for Linear or Interleaved Burst mode• Internal input resistors on mode pins allow floati...

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SeekIC No. : 004355797 Detail

GS8160EV18AT-350: Features: • FT pin for user-configurable flow through or pipeline operation • Dual Cycle Deselect (DCD) operation• 1.8 V +10%/10% core power supply• 1.8 V I/O supply•LB...

GS8160EV18AT-350 Data Sheet

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Part Number:
GS8160EV18AT-350
Supply Ability:
5000

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  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

• FT pin for user-configurable flow through or pipeline operation
• Dual Cycle Deselect (DCD) operation
• 1.8 V +10%/10% core power supply
• 1.8 V I/O supply
• LBO pin for Linear or Interleaved Burst mode
• Internal input resistors on mode pins allow floating mode pins
• Default to Interleaved Pipeline mode
• Byte Write (BW) and/or Global Write (GW) operation
• Internal self-timed write cycle
• Automatic power-down for portable applications
• JEDEC-standard 100-lead TQFP package


Application

The GS8160EV18/32/36AT is an 18,874,368-bit (16,777,216- bit for x32 version) high performance synchronous SRAM with a 2-bit burst address counter. Although of a type originally developed for Level 2 Cache applications supporting high performance CPUs, the device now finds application in synchronous SRAM applications, ranging from DSP main store to networking chip set support.




Pinout

Connection Diagram


Specifications

Symbol Description
Value
Unit
VDD Voltage on VDD Pins
0.5 to 3.6
V
VDDQ Voltage on VDDQ Pins
0.5 to 3.6
V
VI/O Voltage on I/O Pins
0.5 to VDDQ +0.5 ( 3.6 V max.)
V
VIN Voltage on Other Input Pins
0.5 to VDD +0.5 ( 3.6 V max.)
V
IIN Input Current on Any Pin
+/20
mA
IOUT Output Current on Any I/O Pin
+/20
mA
PD Package Power Dissipation
1.5
W
TSTG Storage Temperature
55 to 125
TBIAS Temperature Under Bias
55 to 125
Note:
Permanent damage to the device may occur if the Absolute Maximum Ratings are exceeded. Operation should be restricted to Recommended Operating Conditions. Exposure to conditions exceeding the Absolute Maximum Ratings, for an extended period of time, may affect reliability of this component.


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