Features: ·Low VCE(SAT)·Non Punch Through Silicon·Isolated Copper Baseplate·Low Inductance Internal ConstructionApplication·High Reliability Inverters·Motor Controllers·Traction Drives·Resonant ConvertersSpecificationsStresses above those listed under 'Absolute Maximum Ratings' may cause permanent...
GP401DDS18: Features: ·Low VCE(SAT)·Non Punch Through Silicon·Isolated Copper Baseplate·Low Inductance Internal ConstructionApplication·High Reliability Inverters·Motor Controllers·Traction Drives·Resonant Conv...
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Features: ·High Thermal Cycling Capability·400A Per Switch·Non Punch Through Silicon·Isolated MMC ...
Features: ·Non Punch Through Silicon·Isolated Copper Baseplate·Low Inductance Internal Constructio...
Stresses above those listed under 'Absolute Maximum Ratings' may cause permanent damage to the device. In extreme conditions, as with all semiconductors, this may include potentially hazardous rupture of the package. Appropriate safety precautions should always be followed. Exposure to Absolute Maximum Ratings may affect device reliability.
Tcase = 25°C unless stated otherwise
Symbol |
Parameter |
Test Conditions |
Max. |
Unit |
VCES | Collector-emitter voltage |
VGE = 0V |
1800 |
V |
VGES | Gate-emitter voltage |
|
±20 |
V |
IC | Collector current |
Tcase = 70 °C |
400 |
A |
IC(PK) | Peak collector current |
1ms, Tcase = 110°C |
800 |
A |
Pmax | Max. transistor power dissipation |
Tcase = 25°C, Tj = 125°C |
3000 |
W |
Visol | Isolation voltage |
Commoned terminals to base plate. AC RMS, 1 min, 50Hz |
4000 |
V |