Features: • >2.5 V/ns Driver Slew Rates• Adjustable Driver Slew Rates• HiZ Capability• 12 V Output Range• 9 V Output Swings• 28-Pin PLCC with an Internal Heat SpreaderApplication• Memory Test Equipment• InstrumentationPinoutSpecifications Par...
Edge693: Features: • >2.5 V/ns Driver Slew Rates• Adjustable Driver Slew Rates• HiZ Capability• 12 V Output Range• 9 V Output Swings• 28-Pin PLCC with an Internal Heat ...
SeekIC Buyer Protection PLUS - newly updated for 2013!
268 Transactions
All payment methods are secure and covered by SeekIC Buyer Protection PLUS.
Parameter | Symbol | Min | Typ | Max | Units |
VCC (Relative to GND) VEE (Relative to GND Total Power Supply Digital Input Voltages Differential Digital Input Voltages Analog Voltages Analog Input Currents Driver Bias Slew Rate Adjust Driver Output Current (Static) Ambient Operating Temperature Storage Temperature Junction Temperature Soldering Temperature (5 seconds, 1/4" from pin) |
VCC |
0 |
+14.0 |
V |
The Edge693 is a dual pin electronics driver solution manufactured in a high-performance, complementary bipolar process. In Automatic Test Equipment (ATE) applications, the Edge693 offers two pin drivers suitable for drive-only channels in memory testers, as well as for bidirectional channels in memory, VLSI, and mixed- signal test systems.
Each driver Edge693 is completely isolated from the other. There are separate data, enable, slew rate adjust, high and low levels; as well as power supply inputs for each driver. The driver output slew rate is adjustable from 3 V/ns to 1 V/ns, allowing the matching of edges from channel-tochannel, as well as slowing down edges for noise sensitive applications.
Each driver Edge693 is capable of driving 9 V signals over a 12 V range, in addition to going into a high impedance state. The Edge693 can generate ECL signals up to 500 MHz and 3V signals in excess of 300 MHz.
Combining two independent drivers Edge693 into a 28-pin PLCC package offers a highly integrated solution appropriate where speed and density are at a premium.