DS26LV31T

Features: ` Industrial product meets TIA/EIA-422-B (RS-422) and ITU-T V.11 recommendation` Military product conforms to TIA/EIA-422-B (RS-422)` Interoperable with existing 5V RS-422 networks` Industrial and Military temperature range` Guaranteed VOD of 2V min over operating conditions` Balanced ou...

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DS26LV31T Picture
SeekIC No. : 004328924 Detail

DS26LV31T: Features: ` Industrial product meets TIA/EIA-422-B (RS-422) and ITU-T V.11 recommendation` Military product conforms to TIA/EIA-422-B (RS-422)` Interoperable with existing 5V RS-422 networks` Indust...

floor Price/Ceiling Price

Part Number:
DS26LV31T
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/12/21

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Product Details

Description



Features:

` Industrial product meets TIA/EIA-422-B (RS-422) and ITU-T V.11 recommendation
` Military product conforms to TIA/EIA-422-B (RS-422)
` Interoperable with existing 5V RS-422 networks
` Industrial and Military temperature range
` Guaranteed VOD of 2V min over operating conditions
` Balanced output crossover for low EMI (typical within 40 mV of 50% voltage level)
` Low power design (330 µW 3.3V static)
` ESD 7 kV on cable I/O pins (HBM)
` Guaranteed AC parameter:
- Maximum driver skew: 2 ns
- Maximum transition time: 10 ns
` Pin compatible with DS26C31
` Available in SOIC and Cerpack packaging
` Standard Microcircuit Drawing (SMD) 5962-98584





Specifications

Temperature Min -40 deg C
Temperature Max 85 deg C
Receivers 0
SupplyVoltage 3.3 Volt
Process CMOS
Temperature Min -40 deg C
Temperature Max 85 deg C
View Using Catalog


Supply Voltage (VCC) .....................................................−0.5V to +7V
Enable Input Voltage (EN, EN*) ..........................−0.5V to VCC + 0.5V
Driver Input Voltage (DI) .....................................−0.5V to VCC + 0.5V
Clamp Diode Current ..............................................................±20 mA
DC Output Current, per pin ..................................................±150 mA
Driver Output Voltage (Power Off: DO+, DO−) ...............−0.5V to +7V
Maximum Package Power Dissipaton +25°C M Package ......1226 mW
W Package ...........................................................................1119 mW
Derate M Package 9.8 mW/°C above ........................................+25°C
Derate W Package 7.5 mW/°C above .......................................+25°C
Storage Temperature Range ...................................−65°C to +150°C
Lead Temperature Range Soldering (4 sec.) ...........................+260°C
ESD Ratings (HBM, 1.5 k, 100 pF) Driver Outputs .....................7 kV
Other Pins ................................................................................2.5 kV





Description

The DS26LV31T is a high-speed quad differential CMOS driver that meets the requirements of both TIA/EIA-422-B and ITU-T V.11. The CMOS DS26LV31T features low static ICC of 100µA MAX which makes it ideal for battery powered and power conscious applications.

Differential outputs have the same VOD guarantee (>=2V) as the 5V version.

The EN and EN* inputs allow active Low or active High control of the TRI-STATE® outputs. The enables are common to all four drivers. Protection diodes protect all the driver inputs against electrostatic discharge. Outputs have enhanced ESD protection providing greater than 7 kV tolerance. The driver and enable inputs (DI, EN, EN*) are compatible with low voltage LVTTL and LVCMOS devices.

Reliability Metrics


Part Number Process EFR Reject EFR Sample Size PPM LTA Rejects LTA Device Hours FITS MTTF (Hours)
DS26LV31TM CS200* 0 9850 0 0 3375000 2 957665465
DS26LV31TMX CS200* 0 9850 0 0 3375000 2 957665465

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

For more information on Reliability Metrics, please click here.







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