95510267

Description

The XRD 1640 AL1 ES is a digital X-Ray detector based on a 16'' amorphous silicon sensor operating as a two-dimensional photodiode array. It's the Enhanced Speed version of the RID 1640 AL1. For the conversion of X-Rays into light, the detector uses a Kodak™ Lanex Fast Scintillator. With a pixel size of 400 µm and a resolution of 1024 x 1024 pixels at a frame rate of 7 Hz, the detector is designed to fulfill the requirements of a variety of Industrial as well as Medical Applications. All PerkinElmer Amorphous Silicon Detectors 1640 are well suited to perform digital X-Ray Imaging and contain all drive and read-out electronics, including an X-Ray interlock. X-Rays are converted into light using different scintillators. The information about 1640 is digitized in 16 bit to achieve highest dynamic range and contrast.