95510232

Description

The XRD 512-400 AL1 is a digital X-Ray detector based on an 8'' amorphous silicon sensor operating as a two-dimensional photodiode array. For the conversion of X-Rays into light, the detector uses a Kodak™ Lanex Fast Scintillator. With a pixel size of 400 µm and a resolution of 512 x 512 pixels at a frame rate of 7 Hz, the detector is designed to fulfill the requirements of a variety of Industrial as well as Medical Applications. All PerkinElmer Amorphous Silicon Detectors 512-400 are well suited to perform digital X-Ray Imaging and contain all drive and read-out electronics, including an X-Ray interlock. X-Rays are converted into light using different scintillators. The information about 512-400 is digitized in 16 bit to achieve highest dynamic range and contrast.