74LVT623D

The 74LVT623D belongs to 74LVT623 family which is a high-performance BiCMOS product designed for VCC operation at 3.3 V and the device is an octal transceiver featuring noninverting 3-State bus compatible outputs in both send and receive directions. The 74LVT623 is designed for asynchronous two-way communication between data buses. The control function implementation allows for maximum flexibility in timing. This device allows data transmission from the A bus to the B bus or from the B bus to the A bus, depending upon the logic levels at the Enable inputs (OEBA and OEAB). The Enable inputs can be used to disable the device so that the buses are effectively isolated. Control of data flow from B to A is similar, but using the EBA, LEBA, and OEBA inputs.

The features of 74LVT623D can be summarized as (1)separate controls for data flow in each direction; (2)output capability: +64 mA/32 mA; (3)TTL input and output switching levels; (4)input and output interface capability to systems at 5 V supply; (5)bus-hold data inputs eliminate the need for external pull-up resistors to hold unused inputs; (6)live insertion/extraction permitted; (7)no bus current loading when output is tied to 5 V bus; (8)power-up 3-state; (9)power-up reset; (10)latch-up protection exceeds 500 mA per JEDEC Std 17; (11)ESD protection exceeds 2000 V per MIL STD 883 Method 3015 and 200 V per machine model.

The absolute maximum ratings of 74LVT623D are (1)VCC DC supply voltage: -0.5 to +4.6 V; (2)IIK DC input diode current (VI < 0): -50 mA; (3)VI DC input voltage3: -0.5 to +7.0 V; (4)IOK DC output diode current(VO < 0): -50 mA; (5)VOUT DC output voltage3(output in off or high state): -0.5 to +7.0V; (6)IOUT DC output current(output in low state/output in high state): 128/-64mA; (7)Tstg storage temperature range: -65 to 150 °C.(1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C. 3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.).