DescriptionThe 74LV00D belongs to 74LV00 family which is a low-voltage Si-gate CMOS device that is pin and function compatible with 74HC/HCT00. The 74LV00 provides the 2-input NAND function. The features of 74LV00D can be summarized as (1)wide operating voltage: 1.0 to 5.5 V; (2)optimized for low...
74LV00D: DescriptionThe 74LV00D belongs to 74LV00 family which is a low-voltage Si-gate CMOS device that is pin and function compatible with 74HC/HCT00. The 74LV00 provides the 2-input NAND function. The fe...
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The 74LV00D belongs to 74LV00 family which is a low-voltage Si-gate CMOS device that is pin and function compatible with 74HC/HCT00. The 74LV00 provides the 2-input NAND function.
The features of 74LV00D can be summarized as (1)wide operating voltage: 1.0 to 5.5 V; (2)optimized for low voltage applications: 1.0 to 3.6 V; (3)accepts TTL input levels between VCC = 2.7 V and VCC = 3.6 V; (4)typical VOLP (output ground bounce) < 0.8 V at VCC = 3.3 V, Tamb = 25°C; (5)typical VOHV (output VOH undershoot) > 2 V at VCC = 3.3 V, Tamb = 25°C; (6)output capability: standard; (7)ICC category: SSI.
The absolute maximum ratings of 74LV00D are (1)VCC DC supply voltage: -0.5 to +7.0 V; (2)±IIK DC input diode current(VI < -0.5 or VI > VCC + 0.5V): 20mA; (3)±IOK DC output diode current(VO < -0.5 or VO > VCC + 0.5V): 50mA; (4)±IO(DC output source or sink current -standard outputs(-0.5V < VO < VCC + 0.5V): 25mA; (5)±IGND, ±ICC DC VCC or GND current for types with -standard outputs: 50mA; (6)Tstg storage temperature range: -65 to +150 °C; (7)PTOT power dissipation per package(for temperature range: -40 to +125°C) - plastic DIL(above +70°C derate linearly with 12 mW/K) - plastic mini-pack (SO) (SSOP and TSSOP)(above +70°C derate linearly with 8 mW/K)- plastic shrink mini-pack(above +60°C derate linearly with 5.5mW/K): 750/500/400mW.(NOTES: 1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under arecommended operating conditionso is not implied. Exposure to absolute-maximum-rated conditions of the 74LV00D for extended periods may affect device reliability. 2.The input and output voltage ratings may be exceeded if the input and output current ratings are observed.)