DescriptionThe 74LV541N belongs to the 74LV541 family which is an octal non-inverting buffer/line driver with 3-State outputs. The 3-State outputs are controlled by the output enable inputs OE1 and OE2. A HIGH on OEn causes the outputs to assume a high impedance OFF-The 74LV541 is a low-voltage CM...
74LV541N: DescriptionThe 74LV541N belongs to the 74LV541 family which is an octal non-inverting buffer/line driver with 3-State outputs. The 3-State outputs are controlled by the output enable inputs OE1 and ...
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The 74LV541N belongs to the 74LV541 family which is an octal non-inverting buffer/line driver with 3-State outputs. The 3-State outputs are controlled by the output enable inputs OE1 and OE2. A HIGH on OEn causes the outputs to assume a high impedance OFF-The 74LV541 is a low-voltage CMOS device and is pin and function compatible with 74HC/HCT541.
The features of 74LV541N can be summarized as (1)optimized for low voltage applications: 1.0 to 3.6V; (2)accepts TTL input levels between VCC = 2.7V and VCC = 3.6V; (3)typical VOLP (output ground bounce) <0.8V @ VCC = 3.3V, Tamb = 25°C; (4)typical VOHV (output VOH undershoot) <2V @ VCC = 3.3V, Tamb = 25°C; (5)non-inverting outputs; (6)output capability: bus driver; (7)ICC category: MSI.
The absolute maximum ratings of 74LV541N are (1)VCC DC supply voltage: -0.5 to +4.6 V; (2)±IIK DC input diode current(VI < -0.5 or VI > VCC + 0.5V): 20mA; (3)±IOK DC output diode current(VO < -0.5 or VO > VCC + 0.5V): 50mA; (4)±IO DC output source or sink current -bus driver outputs(-0.5V < VO < VCC + 0.5V): 35mA; (5)±IGND, ±ICC DC VCC or GND current for types with bus driver outputs: 70mA; (6)Tstg storage temperature range: -65 to +150 °C; (7)power dissipation per package for temperature range: -40 to +125°C-plastic DIL(above +70°C derate linearly with 12mW/K)/-plastic mini-pack (SO)(above +70°C derate linearly with 8 mW/K)/-plastic shrink mini-pack (SSOP and TSSOP)(above +60°C derate linearly with 5.5 mW/K) of the 74LV541N: 750/500/400mW.(1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under arecommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The input and output voltage ratings of the 74LV541N may be exceeded if the input and output current ratings are observed.)