Features: • Optimized for low voltage applications: 1.0 to 3.6 V• Accepts TTL input levels between VCC = 2.7 V and VCC = 3.6 V• Typical VOLP (output ground bounce) < 0.8 V at VCC = 3.3 V, Tamb = 25°C• Typical VOHV (output VOH undershoot) > 2 V at VCC = 3.3 V, Tamb = 2...
74LV4094: Features: • Optimized for low voltage applications: 1.0 to 3.6 V• Accepts TTL input levels between VCC = 2.7 V and VCC = 3.6 V• Typical VOLP (output ground bounce) < 0.8 V at VC...
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SYMBOL | PARAMETER | CONDITIONS | RATING | UNIT |
VCC | DC supply voltage | 0.5 to +7.0 | V | |
±IIK | DC input diode current | VI < 0.5 or VI > VCC + 0.5V | 20 | mA |
±IOK | DC output diode current | VO < 0.5 or VO > VCC + 0.5V | 50 | mA |
±IO | DC output source or sink current standard outputs |
0.5V < VO < VCC + 0.5V | 35 | mA |
±IGND, ±ICC |
DC VCC or GND current for types with standard outputs |
70 | mA | |
Tstg | Storage temperature range | 65 to +150 | °C | |
PTOT | Power dissipation per package plastic DIL plastic mini-pack (SO) plastic shrink mini-pack (SSOP and TSSOP) |
for temperature range: 40 to +125°C above +70°C derate linearly with 12 mW/K above +70°C derate linearly with 8 mW/K above +60°C derate linearly with 5.5 mW/K |
750 500 400 |
mW |
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
The 74LV4094 is a low-voltage Si-gate CMOS device and is pin and function compatible with 74HC/HCT4094.
The 74LV4094 is an 8-stage serial shift register having a storage latch associated with each stage for strobing data from the serial input (D) to the parallel buffered 3-State outputs (QP0 to OP7). The parallel outputs may be connected directly to the common bus lines. Data is shifted on the positive-going clock (CP) transitions. The data in each shift register is transferred to the storage register when the strobe input (STR) is HIGH. Data in the storage register appears at the outputs whenever the output enable input (OE) signal is HIGH. Two serial outputs (QS1 and QS2) are available for cascading a number of 74LV4094 devices. Data is available at QS1 on the positive-going clock edges to allow high-speed operation in cascaded systems in which the clock rise time is fast. The same serial information of the 74LV4094 is available at QS2 on the next negative going clock edge and is for cascading 74LV4094 devices when the clock
rise time is slow.