DescriptionThe 74LV32N belongs to 74LV32 family which is a low-voltage Si-gate CMOS device and is pin and function compatible with 74HC/HCT32. The 74LV32 provides the 2-input OR function. The features of 74LV32N can be summarized as (1)wide operating voltage: 1.0 to 5.5 V; (2)optimized for low vo...
74LV32N: DescriptionThe 74LV32N belongs to 74LV32 family which is a low-voltage Si-gate CMOS device and is pin and function compatible with 74HC/HCT32. The 74LV32 provides the 2-input OR function. The featu...
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The 74LV32N belongs to 74LV32 family which is a low-voltage Si-gate CMOS device and is pin and function compatible with 74HC/HCT32. The 74LV32 provides the 2-input OR function.
The features of 74LV32N can be summarized as (1)wide operating voltage: 1.0 to 5.5 V; (2)optimized for low voltage applications: 1.0 to 3.6 V; (3)accepts TTL input levels between VCC = 2.7 V and VCC = 3.6 V; (4)typical VOLP (output ground bounce) < 0.8 V at VCC = 3.3 V, Tamb = 25°C; (5)typical VOHV (output VOH undershoot) > 2 V at VCC = 3.3 V, TAMB = 25°C; (6)output capability: standard; (7)ICC category: SSI.
The absolute maximum ratings of the 74LV32N are (1)VCC DC supply voltage: -0.5(MIN)/+7.0(MAX)V; (2)Tstg storage temperature range: -65 to +150°C; (3)IIK DC input diode current(VI < -0.5 V; note 1): 20mA(MAX); (4)IOK DC output diode current( VO <-0.5 V or VO > VCC+ 0.5 V; note 1): 50mA; (5)IO DC output source or sink current(-0.5 V < VO < VCC + 0.5 V): 25mA; (6)±IGND, ±ICC DC VCC or GND current for types with-standard outputs: 50mA; (7)PD power dissipation per package(for temperature range: -40 to +125 °C; note 2): 500mW(NOTE: 1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under arecommended operating conditionso is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The input and output voltage ratings of the 74LV32N may be exceeded if the input and output current ratings are observed).