74LV132N

The 74LV132N belongs to 74LV132 family which is a low-voltage Si-gate CMOS device and is pin and function compatible with 74HC/HCT132. The gate switches at different points for positive and negative-going signals. The difference between the positive voltage VT+ and the negative voltage VT± is defined as the hysteresis voltage VH. It can be used in wave and pulse shapers, astable multivibrators, monostable multivibrators. The 74LV132 contains four 2-input NAND gates which accept standard input signals. They are capable of transforming slowly changing input signals into sharply defined, jitter-free output signals.

The features of 74LV132N can be summarized as (1)wide operating voltage: 1.0 to 5.5V; (2)optimized for low voltage applications: 1.0 to 3.6V; (3)accepts TTL input levels between VCC = 2.7V and VCC = 3.6V; (4)typical VOLP (output ground bounce) < 0.8V @ VCC = 3.3V, Tamb = 25°C; (5)typical VOHV (output VOH undershoot) < 2V @ VCC = 3.3V, Tamb = 25°C; (6)output capability: standard; (7)ICC category: SSI.

The absolute maximum ratings of 74LV132N are (1)VCC DC supply voltage: ±0.5 to +7.0 V; (2)±IIK DC input diode current(VI < ±0.5 or VI > VCC + 0.5V): 20mA; (3)±IOK DC output diode current(VO < ±0.5 or VO > VCC + 0.5V):50mA; (4)±IO DC output source or sink current-standard outputs(-0.5V < VO < VCC + 0.5V): 25mA; (5)±IGND, ±ICC DC VCC or GND current for types with-standard outputs: 50mA; (6)Tstg storage temperature range: -65 to +150 °C; (7)PTOT power dissipation per package(for temperature range: -40 to +125°C)- plastic DIL(above +70°C derate linearly with 12 mW/K):750mW- plastic mini-pack (SO)(above +70°C derate linearly with 8 mW/K): 500mW - plastic shrink mini-pack (SSOP and TSSOP)(above +60°C derate linearly with 5.5 mW/K):400mW(NOTES: 1.Stresses beyond those listed may cause permanent damage to the 74LV132N. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under arecommended operating conditionso is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2.The input and output voltage ratings of the 74LV132N may be exceeded if the input and output current ratings are observed.).