DescriptionThe 74LV11N belongs to 74LV11 family which is a low-voltage Si-gate CMOS device and is pin and function compatible with 74HC/HCT11. The 74LV11 provides the 3-input AND function. The features of 74LV11N can be summarized as (1)optimized for low voltage applications: 1.0 to 3.6 V; (2)acc...
74LV11N: DescriptionThe 74LV11N belongs to 74LV11 family which is a low-voltage Si-gate CMOS device and is pin and function compatible with 74HC/HCT11. The 74LV11 provides the 3-input AND function. The feat...
SeekIC Buyer Protection PLUS - newly updated for 2013!
268 Transactions
All payment methods are secure and covered by SeekIC Buyer Protection PLUS.
The 74LV11N belongs to 74LV11 family which is a low-voltage Si-gate CMOS device and is pin and function compatible with 74HC/HCT11. The 74LV11 provides the 3-input AND function.
The features of 74LV11N can be summarized as (1)optimized for low voltage applications: 1.0 to 3.6 V; (2)accepts TTL input levels between VCC = 2.7 V and VCC = 3.6 V; (3)typical VOLP (output ground bounce) < 0.8 V at VCC = 3.3 V, Tamb = 25°C; (4)typical VOHV (output VOH undershoot) > 2 V at VCC = 3.3 V, Tamb = 25°C; (5)output capability: standard; (6)ICC category: SSI.
The absolute maximum ratings of 74LV11N are (1)VCC DC supply voltage: -0.5 to +4.6 V; (2)±IIK DC input diode current(VI <-0.5 or VI > VCC + 0.5V): 20mA; (3)±IOK DC output diode current(VO < -0.5 or VO > VCC + 0.5V): 50mA; (4)±IO DC output source or sink current -bus driver outputs(-0.5V < VO < VCC + 0.5V): 25mA; (5)±IGND, ±ICC DC VCC or GND current for types with bus driver outputs: 50mA; (6)Tstg storage temperature range: -65 to +150 °C; (7)power dissipation per package for temperature range of the 74LV11N: -40 to +125°C-plastic DIL(above +70°C derate linearly with 12mW/K)/-plastic mini-pack (SO)(above +70°C derate linearly with 8 mW/K)/-plastic shrink mini-pack (SSOP and TSSOP)(above +60°C derate linearly with 5.5 mW/K): 750/500/400mW.(1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under arecommended operating conditions pf the 74LV11N is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.)