74LV08N

DescriptionThe 74LV08N belongs to 74LV08 which provides the 2-input AND function. The 74LV08N is a low-voltage Si-gate CMOS device and is pin and function compatible with 74HC/HCT08. The features of 74LV08N can be summarized as (1)wide operating voltage: 1.0 to 5.5 V; (2)optimized for low voltage...

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SeekIC No. : 004251120 Detail

74LV08N: DescriptionThe 74LV08N belongs to 74LV08 which provides the 2-input AND function. The 74LV08N is a low-voltage Si-gate CMOS device and is pin and function compatible with 74HC/HCT08. The features o...

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Part Number:
74LV08N
Supply Ability:
5000

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  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/2/15

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Product Details

Description



Description

The 74LV08N belongs to 74LV08 which provides the 2-input AND function. The 74LV08N is a low-voltage Si-gate CMOS device and is pin and function compatible with 74HC/HCT08.

The features of 74LV08N can be summarized as (1)wide operating voltage: 1.0 to 5.5 V; (2)optimized for low voltage applications: 1.0 to 3.6 V; (3)accepts TTL input levels between VCC = 2.7 V and VCC = 3.6 V; (4)typical VOLP (output ground bounce) < 0.8 V at VCC = 3.3 V, Tamb = 25°C.; (5)typical VOHV (output VOH undershoot) > 2 V at VCC = 3.3 V, Tamb = 25°C.; (6)output capability: standard; (7)ICC category: SSI.

The absolute maximum ratings of 74LV08N are (1)VCC DC supply voltage: -0.5 to +7.0 V; (2)±IIK DC input diode current(VI < -0.5 or VI > VCC + 0.5V): 20mA; (3)±IOK DC output diode current(VO < -0.5 or VO > VCC + 0.5V):50 mA; (4)±IO DC output source or sink current-standard outputs(-0.5V < VO < VCC + 0.5V): 25mA; (5)±IGND, ±ICC DC VCC or GND current for types with -standard outputs: 50mA; (6)Tstg storage temperature range of the 74LV08N: -65 to +150 °C.(1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under arecommended operating conditionso is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The input and output voltage ratings of the 74LV08N may be exceeded if the input and output current ratings are observed.)




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