74LV04N

Minimum Operating Temperature :
Operating Temperature Range :
Propagation Delay Time :
Maximum Operating Temperature : + 125 C
Number of Circuits : 6
Logic Type : CMOS
Supply Voltage - Max : 5.5 V
Package / Case : PDIP-14
Packaging : Tube
Logic Family : LV
High Level Output Current : - 12 mA
Low Level Output Current : 12 mA
Supply Voltage - Min : 1 V


Description

The 74LV04N belongs to 74LV04 family which provides six inverting buffers. The 74LV04 is a low-voltage Si-gate CMOS device that is pin and function compatible with 74HC/HCT04.

The features of 74LV04N can be summarized as (1)wide operating voltage: 1.0 to 5.5 V; (2)optimized for low voltage applications: 1.0 to 3.6 V; (3)accepts TTL input levels between VCC = 2.7 V and VCC = 3.6 V; (4)typical VOLP (output ground bounce) < 0.8 V at VCC = 3.3 V, Tamb = 25°C; (5)typical VOHV (output VOH undershoot) > 2 V at VCC = 3.3 V, Tamb = 25°C; (6)output capability: standard; (7)ICC category: SSI

The absolute maximum ratings of 74LV04N are (1)VCC DC supply voltage: -0.5 to +7.0 V; (2)±IIK DC input diode current(VI < -0.5 or VI > VCC + 0.5V): 20mA; (3)±IOK DC output diode current(VO < -0.5 or VO > VCC + 0.5V): 50mA; (4)±IO(DC output source or sink current -standard outputs(-0.5V < VO < VCC + 0.5V): 25mA; (5)±IGND, ±ICC DC VCC or GND current for types with -standard outputs: 50mA; (6)Tstg storage temperature range: -65 to +150 °C; (7)PTOT power dissipation per package(for temperature range: -40 to +125°C) - plastic DIL(above +70°C derate linearly with 12 mW/K) - plastic mini-pack (SO) (SSOP and TSSOP)(above +70°C derate linearly with 8 mW/K)- plastic shrink mini-pack(above +60°C derate linearly with 5.5mW/K): 750/500/400mW. (NOTES: 1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the 74LV04N at these or any other conditions beyond those indicated under arecommended operating conditionso is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.)