DescriptionThe 74LV02N belongs to the 74LV02 family which is a low-voltage Si-gate CMOS device that is pin and function compatible with 74HC/HCT02 AND it provides the 2-input NOR function. The features of 74LV02N can be summarized as (1)wide operating voltage: 1.0 to 5.5 V; (2)optimized for low v...
74LV02N: DescriptionThe 74LV02N belongs to the 74LV02 family which is a low-voltage Si-gate CMOS device that is pin and function compatible with 74HC/HCT02 AND it provides the 2-input NOR function. The feat...
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The 74LV02N belongs to the 74LV02 family which is a low-voltage Si-gate CMOS device that is pin and function compatible with 74HC/HCT02 AND it provides the 2-input NOR function.
The features of 74LV02N can be summarized as (1)wide operating voltage: 1.0 to 5.5 V; (2)optimized for low voltage applications: 1.0 to 5.5 V; (3)accepts TTL input levels between VCC = 2.7 V and VCC = 3.6 V; (4)typical VOLP (output ground bounce) < 0.8 V at VCC = 3.3 V, tamb = 25°C; (5)Typical VOHV (output VOH undershoot) > 2 V at VCC = 3.3 V, tamb = 25°C; (6)output capability: standard; (7)ICC category: SSI.
The absolute maximum ratings of 74LV02N are (1)VCC DC supply voltage: -0.5 to +7.0 V; (2)±IIK DC input diode current VI < ±0.5 or VI > VCC + 0.5V: 20 mA; (3)±IOK DC output diode current VO < -0.5 or VO > VCC + 0.5V:50 mA; (4)±IO DC output source or sink current -standard outputs: -0.5V < VO < VCC + 0.5V: 25mA; (5)±IGND, ±ICC DC VCC or GND current for types with- standard outputs: 50mA; (6)Tstg storage temperature range: -65 to +150 °C; (7)PTOT power dissipation per package(for temperature range: -40 to +125°C): - plastic DIL(above +70°C derate linearly with 12 mW/K): 750mW- plastic mini-pack (SO)(above +70°C derate linearly with 8 mW/K): 500mW - plastic shrink mini-pack (SSOP and TSSOP)(above +60°C derate linearly with 5.5 mW/K): 400mW(NOTES:1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the; (8)device at these or any other conditions beyond those indicated under arecommended operating conditionso is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The input and output voltage ratings of the 74LV02N may be exceeded if the input and output current ratings are observed.)