74FCT162511CT

Features: • 0.5 MICRON CMOS Technology• Typical tsk(o) (Output Skew) < 250ps, clocked mode• Low input and output leakage 1A (max)• ESD > 2000V per MIL-STD-883, Method 3015;> 200V using machine model (C = 200pF, R = 0)• Packages include 25 mil pitch SSOP, 19.6...

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74FCT162511CT Picture
SeekIC No. : 004249975 Detail

74FCT162511CT: Features: • 0.5 MICRON CMOS Technology• Typical tsk(o) (Output Skew) < 250ps, clocked mode• Low input and output leakage 1A (max)• ESD > 2000V per MIL-STD-883, Method 3...

floor Price/Ceiling Price

Part Number:
74FCT162511CT
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/12/21

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Product Details

Description



Features:

• 0.5 MICRON CMOS Technology
• Typical tsk(o) (Output Skew) < 250ps, clocked mode
• Low input and output leakage 1A (max)
• ESD > 2000V per MIL-STD-883, Method 3015;> 200V using machine model (C = 200pF, R = 0)
• Packages include 25 mil pitch SSOP, 19.6 mil pitch TSSOP,15.7 mil pitch TVSOP and 25 mil pitch Cerpack
• Extended commercial range of 40°C to +85°C
• VCC = 5V ±10%
• Balanced Output Drivers: ±24mA (commercial) ±16mA (military)
• Series current limiting resistors
• Generate/Check, Check/Check modes
• Open drain parity error allows wire-OR



Pinout

  Connection Diagram




Specifications

Symbol

Description

Max.

Unit

VTERM(2)

Terminal Voltage with Respect to
GND

0.5 to +7.0

V

VTERM(3)

Terminal Voltage with Respect to
GND

0.5 to
VCC +0.5

V

TSTG

Storage Temperature

65 to +150

°C

IOUT

DC Output Current

60 to +120

mA


NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. Open drain and all device terminals except FCT162XXXT Output and I/O terminals.
3. Output and I/O terminals for FCT162XXXT.



Description

The 74FCT162511CT 16-bit registered/latched transceiver with parity is built using advanced dual metal CMOS technology. This high-speed, low-power transceiver combines Dtype latches and D-type flip-flops to allow data flow in transparent, latched or clocked modes. The device has a parity generator/cheker in the A-to-B direction and a parity checker in the B-to-A direction. Error checking is done at the byte level with separate parity bits for each byte. Separate error flags exits for each direction with a single error flag indicating an error for either byte in the A-to-B direction and a second error flag indicating an error for either byte in the B-to-A direction. The parity error flags of the 74FCT162511CT are open drain outputs which can be tied together and/or tied with flags from other devices to form a single error flag or interrupt. The parity error flags are enabled by the OExx control pins allowing the designer to disable the error flag during combinational transitions.

The control pins LEAB, CLKAB and OEAB control operation of the 74FCT162511CT in the A-to-B direction while LEBA, CLKBA and OEBA control the B-to-A direction. GEN/CHK is only for the selection of A-to-B operation, the B-to-A direction is always in checking mode. The ODD/EVEN select is common between the two directions. Except for the ODD/EVEN control, independent operation can be achieved between the two directions by using the corresponding control lines.




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