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Application4 V gate drive Low drain−source ON-resistance : RDS (ON) = 0.28 (typ.) High forward transfer admittance : |Yfs| = 3.5 S (typ.) Low leakage current : IDSS = 100 A (max) (VDS = 100 V) Enhancement mode : Vth = 0.8~2.0 V (VDS = 10 V, ID = 1 mA)Specifications Characteristics S...

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SeekIC No. : 004226999 Detail

2SK4018: Application4 V gate drive Low drain−source ON-resistance : RDS (ON) = 0.28 (typ.) High forward transfer admittance : |Yfs| = 3.5 S (typ.) Low leakage current : IDSS = 100 A (max) (VDS = 100 V...

2SK4018 Data Sheet

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Part Number:: 2SK4018
Supply Ability:: 5000

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Upload time: 2024/11/23

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2SK4002 evaluate
Features: 􀁺 Low drain−source ON-resistance : RDS (ON) = 4.2 (typ.)􀁺 High ...
2SK4003 evaluate
Features: ` Low drain−source ON-resistance : RDS (ON) = 1.7 (typ.)` Low leakage current : I...
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MOSFET N-CH 600V 3A PW-MOLD

Product Details

Description

Application

4 V gate drive
Low drain−source ON-resistance : R_{DS (ON)} = 0.28 (typ.)
High forward transfer admittance : |Y_fs| = 3.5 S (typ.)
Low leakage current : I_DSS = 100 A (max) (V_DS= 100 V)
Enhancement mode : V_th = 0.8~2.0 V (V_DS = 10 V, I_D = 1 mA)

Specifications

Characteristics		Symbol	Rating	Unit
Drain-source voltage		V_DSS	100	V
Drain?gate voltage (RGS = 20 k)		V_DGR	100	V
Gate?source voltage		V_GSS	±20	V
Drain current	DC (Note 1)	I_D	3	A
Drain current	Pulse (Note 1)	I_DP	12	A
Drain power dissipation (T_c = 25)		P_D	20	W
Single pulse avalanche energy (Note 2)		E_AS	140	mJ
Avalanche current		I_AR	3	A
Repetitive avalanche energy (Note 3)		E_AR	2	mJ
Channel temperature		T_ch	150
Storage temperature range		T_STG	-55 ~ 150

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).

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2SK4018

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