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Application·Recommended for first stages of EQ amplifiers and M.C. head amplifiers. ·High |Yfs|: |Yfs| = 22 mS (typ.) (VDS= 10 V, VGS = 0, IDSS= 3 mA)·Low noise: En= 0.95 nV/Hz1/2 (typ.) (VDS=-10 V, ID =-1mA, f = 1 kHz)·High input impedance: IGSS= 1.0 nA (max) (VGS= 25 V)·Complimentary to 2SK170 S...

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SeekIC No. : 004225378 Detail

2SJ74: Application·Recommended for first stages of EQ amplifiers and M.C. head amplifiers. ·High |Yfs|: |Yfs| = 22 mS (typ.) (VDS= 10 V, VGS = 0, IDSS= 3 mA)·Low noise: En= 0.95 nV/Hz1/2 (typ.) (VDS=-10 V,...

2SJ74 Data Sheet

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Part Number:: 2SJ74
Supply Ability:: 5000

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Product Details

Description

Application

·Recommended for first stages of EQ amplifiers and M.C. head amplifiers.
·High |Y_fs|: |Y_fs| = 22 mS (typ.)   (V_DS = 10 V, V_GS = 0, I_DSS= 3 mA)
·Low noise: E_n= 0.95 nV/Hz^1/2 (typ.)   (V_DS =-10 V, I_D =-1mA, f = 1 kHz)
·High input impedance: I_GSS = 1.0 nA (max) (V_GS= 25 V)
·Complimentary to 2SK170

Specifications

Characteristics	Symbol	Rating	Unit
Gate-drain voltage Gate current Drain power dissipation Junction temperature Storage temperature range	V_GDS I_G P_D T_j T_stg	25 -10 400 125 -55~125	V mA mW

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).

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2SJ74

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