2SJ148 Selling Leads, Price trend, 2SJ148 DataSheet download, circuit diagram from SeekIC.com

Features: • Excellent switching time: ton = 14 ns (typ.)• High forward transfer admittance: |Yfs| = 100 mS (min)• Low on resistance: RDS (ON) = 1.3 Ω (typ.)• Enhancement-mode• Complementary to 2SK982Specifications Characteristics Symbol Rating Un...

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SeekIC No. : 004225019 Detail

2SJ148: Features: • Excellent switching time: ton = 14 ns (typ.)• High forward transfer admittance: |Yfs| = 100 mS (min)• Low on resistance: RDS (ON) = 1.3 Ω (typ.)• Enhancemen...

2SJ148 Data Sheet

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Part Number:: 2SJ148
Supply Ability:: 5000

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Upload time: 2025/3/13

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Recent History
What is this?

2SJ103 evaluate
Application• High breakdown voltage: VGDS = 50 V• High input impedance: IGSS = 1.0 nA ...
2SJ104 evaluate
Application`High input impedance: IGSS= 1.0 nA (max) (VGS= 25 V)`Low RDS(ON)= 40(typ.) (IDSS= 5 mA...
2SJ105 evaluate
Application• High breakdown voltage: VGDS = 50 V• High input impedance: IGSS = 1.0 nA ...

Product Details

Description

Features:

• Excellent switching time: t_on = 14 ns (typ.)
• High forward transfer admittance: |Yfs| = 100 mS (min)
• Low on resistance: R_{DS (ON)} = 1.3 Ω (typ.)
• Enhancement-mode
• Complementary to 2SK982

Specifications

Characteristics		Symbol	Rating	Unit
Drain-Source Voltage		V_DSS	-60	V
Gate-Source Voltage		V_GSS	±20	V
Drain Current	DC	I_D	-200	mA
Drain Current	Pulse	I_DP	-800	mA
Drain power dissipation (Ta = 25)		P_D	400	mW
Channel temperature		T_ch	150
Storage temperature range		T_J, T_STG	-55~150

Note:Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and
         the significant change in temperature, etc.) may cause this product to decrease in the reliability
         significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within
         the absolute maximum ratings. Please design the appropriate reliability upon reviewing the
         Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods)
         and individual reliability data (i.e. reliability test report and estimated failure rate, etc).

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2SJ148

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