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2SJ108

Application• Recommended for first stages of EQ amplifiers and MC head amplifiers.• High |Yfs|: |Yfs| = 22 mS (typ.) (VDS = −10 V, VGS = 0, IDSS = −3 mA)• Low noise: En = 0.95 nV/Hz1/2 (typ.) (VDS = −10 V, ID = −1 mA, f = 1 kHz)• High input impedance...

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SeekIC No. : 004225012 Detail

2SJ108: Application• Recommended for first stages of EQ amplifiers and MC head amplifiers.• High |Yfs|: |Yfs| = 22 mS (typ.) (VDS = −10 V, VGS = 0, IDSS = −3 mA)• Low noise: En...

2SJ108 Data Sheet

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Part Number:
2SJ108
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Application

• Recommended for first stages of EQ amplifiers and MC head amplifiers.
• High |Yfs|: |Yfs| = 22 mS (typ.) (VDS = −10 V, VGS = 0, IDSS = −3 mA)
• Low noise: En = 0.95 nV/Hz1/2 (typ.) (VDS = −10 V, ID = −1 mA, f = 1 kHz)
• High input impedance: IGSS = 1.0 nA (max) (VGS = 25 V)
• Complementary to 2SK370
• Small package


Specifications

Characteristics Symbol Rating Unit
Supply Voltage VGDS 25 V
Gate current IG 10 mA
Drain power dissipation PD 200 mW
Junction temperature Tj 125
Storage temperature TSTG −55~125

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).


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