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The TL16C554A is an enhanced quadruple version of the TL16C550C asynchronous-communications element (ACE). Each channel performs serial-to-parallel conversion on data characters received from peripheral devices or modems and parallel-to-serial conversion on data characters transmitted by the CPU. The complete status of each channel of the quadruple ACE can be read by the CPU at any time during operation. The information obtained includes the type and condition of the operation performed and any error conditions encountered.
The TL16C554A quadruple ACE can be placed in an alternate FIFO mode, which activates the internal FIFOs to allow 16 bytes (plus three bits of error data per byte in the receiver FIFO) to be stored in both receive and transmit modes. In the FIFO mode of operation, there is a selectable autoflow control feature that can significantly reduce software overhead and increase system efficiency by automatically controlling serial-data flow using RTS output and CTS input signals. All logic is on the chip to minimize system overhead and maximize system efficiency. Two terminal functions allow signaling of direct-memory access (DMA) transfers. Each ACE includes a programmable baud-rate generator that can divide the timing reference clock input by a divisor between 1 and 2161.
The TL16C554A is available in a 68-pin plastic-leaded chip-carrier (PLCC) FN package and in an 80-pin (TQFP) PN package.
TL16C554AI Maximum Ratings
Supply voltage range, VCC (see Note 1) . . . . . . . . . . . . . . . . 0.5 V to 7 V Input voltage range at any input, VI . . . . . . . . . . . . . . . . . . . 0.5 V to 7 V Output voltage range, VO . . . . . . . . . . . . . . . . . . . . . .0.5 V to VCC + 3 V Continuous total-power dissipation at (or below) 70°C . . . . . . . . .500 mW Operating free-air temperature range, TA: TL16C554A . . . . . .0°C to 70°C TL16C554AI . . .40°C to 85°C Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . 65°C to 150°C † Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTE 1: All voltage levels are with respect to GND.