IS61C64A-20N, IS61C64A-25N, IS61C64AH Selling Leads, Datasheet
MFG:ISSI Package Cooled:DIP-28 D/C:9126
IS61C64A-20N, IS61C64A-25N, IS61C64AH Datasheet download

Part Number: IS61C64A-20N
MFG: ISSI
Package Cooled: DIP-28
D/C: 9126
MFG:ISSI Package Cooled:DIP-28 D/C:9126
IS61C64A-20N, IS61C64A-25N, IS61C64AH Datasheet download

MFG: ISSI
Package Cooled: DIP-28
D/C: 9126
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PDF/DataSheet Download
Datasheet: IS604
File Size: 52381 KB
Manufacturer: ISOCOM
Download : Click here to Download
PDF/DataSheet Download
Datasheet: IS604
File Size: 52381 KB
Manufacturer: ISOCOM
Download : Click here to Download
PDF/DataSheet Download
Datasheet: IS61C64AH
File Size: 444091 KB
Manufacturer: ICSI [Integrated Circuit Solution Inc]
Download : Click here to Download
The ICSI IS61C64AH is a very high-speed, low power, 8192-word by 8-bit static RAM. It is fabricated using ICSI's high-performance CMOS technology. This highly reliable process coupled with innovative circuit design techniques, yields access times as fast as 15 ns with low power consumption.
When CE1 is HIGH or CE2 is LOW (deselected), the device assumes a standby mode at which the power dissipation can be reduced down to 250 W (typical) with CMOS input levels.
Easy memory expansion is provided by using two Chip Enable inputs, CE1 and CE2. The active LOW Write Enable (WE) controls both writing and reading of the memory.
The IS61C64AH is packaged in the JEDEC standard 28-pin, 300mil SOJ and 330mil SOP.
|
Symbol |
Parameter |
Value |
Unit |
|
VTERM |
Terminal Voltage with Respect to GND |
0.5 to +7.0 |
V |
|
TBIAS |
Temperature Under Bias |
55 to +125 |
°C |
|
TSTG |
Storage Temperature |
65 to +150 |
°C |
|
PT |
Power Dissipation |
1.0 |
W |
|
IOUT |
DC Output Current (LOW) |
20 |
mA |
Notes: 1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.

