IC42S16400D-7TL, IC42S16400F-6TL, IC42S16800 Selling Leads, Datasheet
MFG:ICSI Package Cooled:TSOP D/C:10+
IC42S16400D-7TL, IC42S16400F-6TL, IC42S16800 Datasheet download
Part Number: IC42S16400D-7TL
MFG: ICSI
Package Cooled: TSOP
D/C: 10+
MFG:ICSI Package Cooled:TSOP D/C:10+
IC42S16400D-7TL, IC42S16400F-6TL, IC42S16800 Datasheet download
MFG: ICSI
Package Cooled: TSOP
D/C: 10+
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PDF/DataSheet Download
Datasheet: IC41C16100A
File Size: 237271 KB
Manufacturer: ICSI [Integrated Circuit Solution Inc]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: IC41C16100A
File Size: 237271 KB
Manufacturer: ICSI [Integrated Circuit Solution Inc]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: IC42S16800-6TI(G)
File Size: 1145624 KB
Manufacturer: ICSI [Integrated Circuit Solution Inc]
Download : Click here to Download
The IC42S81600 and IC42S16800 are high-speed 134,217,728-bit synchronous dynamic randomaccess memories, organized as 4,194,304 x 8 x 4 and 2,097,152 x 16 x 4 (word x bit x bank), respectively.
The synchronous DRAMs achieved high-speed data transfer using the pipeline architecture. All input and outputs are synchronized with the positive edge of the clock.The synchronous DRAMs are compatible with Low Voltage TTL (LVTTL).These products are packaged in 54-pin TSOP-2.
Symbol |
Parameters |
Rating |
Unit |
VDD |
Supply Voltage (with respect to VSS) |
0.5 to +4.6 |
V |
VDDQ |
Supply Voltage for Output (with respect to VSSQ) |
0.5 to +4.6 |
V |
VI |
Input Voltage (with respect to VSS) |
0.5 to VDD+0.5 |
V |
VO |
Output Voltage (with respect to VSSQ) |
1.0 to VDDQ+0.5 |
V |
IO |
Short circuit output current |
50 |
mA |
PD |
Power Dissipation (TA = 25) |
1 |
W |
TOPT |
Operating Temperature Commercial Industrial |
0 to +70 -40 to +85 |
|
TSTG |
Storage Temperature |
65 to +150 |
Notes:
1. Exposing the device to stress above those listed in Absolute Maximum Ratings could cause permanent damage. The device is not meant to be operated under conditions outside the limits described in the operational section of this specification. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability.