BQ4852YMC-85N, BQ48SH-286, BQ48SH-28X6 Selling Leads, Datasheet
MFG:TI Package Cooled:08+09+ D/C:256
BQ4852YMC-85N, BQ48SH-286, BQ48SH-28X6 Datasheet download
Part Number: BQ4852YMC-85N
MFG: TI
Package Cooled: 08+09+
D/C: 256
MFG:TI Package Cooled:08+09+ D/C:256
BQ4852YMC-85N, BQ48SH-286, BQ48SH-28X6 Datasheet download
MFG: TI
Package Cooled: 08+09+
D/C: 256
Want to post a buying lead? If you are not a member yet, please select the specific/related part number first and then fill the quantity and your contact details in the "Request for Quotation Form" on the left, and then click "Send RFQ".Your buying lead can then be posted, and the reliable suppliers will quote via our online message system or other channels soon.
TOP
PDF/DataSheet Download
Datasheet: BQ4010
File Size: 765691 KB
Manufacturer: TI [Texas Instruments]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: BQ4010
File Size: 765691 KB
Manufacturer: TI [Texas Instruments]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: BQ48SH-28X6
File Size: 98471 KB
Manufacturer: TI [Texas Instruments]
Download : Click here to Download
The bq48SH28x6 is the top section suitable for any SOIC (DSH) packaged IC including the bq4802YDSH or bq4802LYDSH parallel real-time clock (RTC) and NVSRAM controller.
The fully integrated SNAPHAT(TM) includes a 6-pF watch crystal and lithium coin cell with 48 mAh of capacity.
The SNAPHAT(TM) is designed to be attached after the DSH packaged base SOIC has been soldered preventing the battery and crystal being over-stressed by the soldering temperatures.
Operating temperature range, TJ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 to 70
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . . . . . . . . . . 40 to 85
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.