Features: ` PLL clock distribution optimized for Double Data Rate SDRAM application up to 266Mhz. ` Distributes one clock Input to one bank of six differential outputs. ` Track spread spectrum clocking for EMI reduction. ` Programmable delay between CLK_INT and CLK[T/C] from 0.8ns to +3.1ns by pro...
PLL102-109: Features: ` PLL clock distribution optimized for Double Data Rate SDRAM application up to 266Mhz. ` Distributes one clock Input to one bank of six differential outputs. ` Track spread spectrum clock...
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` PLL clock distribution optimized for Double Data Rate SDRAM application up to 266Mhz.
` Distributes one clock Input to one bank of six differential outputs.
` Track spread spectrum clocking for EMI reduction.
` Programmable delay between CLK_INT and CLK[T/C] from 0.8ns to +3.1ns by programming CLKINT and FBOUT skew channel, or from 1.1ns to +3.5ns if additional DDR skew channels are enabled.
` Two independent programmable DDR skew chan-nels from 0.3ns to +0.4ns with step size ±100ps.
` Support 2-wire I2C serial bus interface.
` 2.5V Operating Voltage.
` Available in 28-Pin 209mil SSOP.
SYMBOL | PARAMETERS | MIN. | MAX. | UNITS |
VCC | Supply Voltage Range | -0.5 | 3.6 | V |
VI | Input Voltage Range | -0.5 | VCC+0.5 | V |
VO | Output Voltage Range | -0.5 | VCC+0.5 | V |
TS | Storage Temperature | -65 | 150 | |
PW | Maximum power dissipation at TA = 550C in still air | 0.7 | W |
Exposure of the device under conditions beyond the limits specified by Maximum Ratings for extended periods may cause permanent damage to the device and affect product reliability. These conditions represent a stress rating only, and functional operations of the device at these or any other con-ditions above the operational limits noted in this specification is not implied.
The PLL102-109 is a zero delay buffer that distributes a single-ended clock input to six pairs of differential clock outputs and one feedback clock output. Output signal duty cycles are adjusted to 50%, independent of the duty cycle at CLK_INT. The PLL102-109 PLL can be bypassed for test purposes by strapping AVDD to ground.