Features: SpecificationsDescriptionThe Xicor X2201A is a 1024*1 NOVRAM featuring a high-speed static RAM overlaid bit-for-bit with a nonvolatile E2PROM. The X2201A is fabricated with the same reliable N-channel floating gate MOS technology used in all Xicor 5V nonvolatile memories. Xicor NOVRAMs a...
X2201A: Features: SpecificationsDescriptionThe Xicor X2201A is a 1024*1 NOVRAM featuring a high-speed static RAM overlaid bit-for-bit with a nonvolatile E2PROM. The X2201A is fabricated with the same reliab...
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The Xicor X2201A is a 1024*1 NOVRAM featuring a high-speed static RAM overlaid bit-for-bit with a nonvolatile E2PROM. The X2201A is fabricated with the same reliable N-channel floating gate MOS technology used in all Xicor 5V nonvolatile memories. Xicor NOVRAMs are designed for unlimited write operations to RAM, either from the host or recalls from E2PROM. The E2PROM array is designed for a minimum 10,000 store cycles and inherent data retention is specified to be greater than 100 years.
The X2201A has many features, here lists some of them. The first one is: single 5V supply. The second one is: fully TTL compatible. The third one is: infinite E2PROM Array Recall, RAM read and write cycles. The fourth one is: access time of 300ns max. The fifth one is: nonvolatile store inhibit:Vcc=3V typical. The sixth one is: high reliability (store cycles is 10,000 and data retention is 100 years).
The following gives the absolute maximum ratings of some of the important parameters of the X2201A. The Temperature Under Bias of X2201A is from -10 to +85. The Storage Temperature is between -65 and +150. The Voltage on any Pin with Respect to Ground is between -1.0V and +7V. The D.C. Output Current is 5mA. And the Load Temperature (Soldering, 1.0 Seconds) is 300.
Next are some comments for the parameters of X2201A . Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the X2201A. This is a stress rating only and the functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
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