X2001

The Xicor X2001 is a byte-wide NOVRAM featuring a high-speed static RAM overlaid bit-for-bit with a nonvolatile electrical erasable PROM(E2PROM). The X2001 is fabricated with the same reliable N-channel floating gate MOS technology used in all Xicor 5V programmable nonvolatile memories. The X2001 features the JEDEC approved pinout for byte-wide memories, compatible with industry standard RAMs, ROMs, EPROMs and E2PROMs.Xicor NOVRAMs are designed for unlimited write operations to RAM, either from the host or recalls from E2PROM. The E2PROM array is designed for a minimum 100,000 store cycles and inherent data retention is specified to be greater than 100 years.

The X2001 has many features, here lists some of them. The first one is: nonvolatile data integrity. The second one is: automatic store timing. The third one is: store and array recall combined on one line. The fourth one is: enhanced store protection The fifth one is: infinite E2PROM array recall, and RAM read and write cycles. The sixth one is:single 5V supply. The seventh one is: high reliability (store cycles is 100,000 and data retention is 100 years). And the last three are fast access time (200 ns Max), automatic recall on power-up and JEDEC approved byte-wide pinout.

The following gives the absolute maximum ratings of some of the important parameters of the X2001. The Temperature Under Bias of X2001, is from -10 to +85,and is from -65 to +135 for X20011. The Storage Temperature is between -65 and +150. The Voltage on any Pin with Respect to Ground is between -1.0V and +7V. The D.C. Output Current is 5mA. And the Load Temperature (Soldering, 1.0 Seconds) is 300.

Next are some comments for the parameters. Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the X2001. This is a stress rating only and the functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.