WME128K8-XXX

Features: · Read Access Times of 120, 140, 150, 200, 250, 300ns· JEDEC Approved Packages •32 pin, Hermetic Ceramic, 0.600 DIP (Package 300) •32 lead, Hermetic Ceramic, 0.400 SOJ (Package 101)· Commercial, Industrial and Military Temperature Ranges· MIL-STD-883 Compliant Devices Avail...

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WME128K8-XXX Picture
SeekIC No. : 004546269 Detail

WME128K8-XXX: Features: · Read Access Times of 120, 140, 150, 200, 250, 300ns· JEDEC Approved Packages •32 pin, Hermetic Ceramic, 0.600 DIP (Package 300) •32 lead, Hermetic Ceramic, 0.400 SOJ (Packa...

floor Price/Ceiling Price

Part Number:
WME128K8-XXX
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Month Sales

268 Transactions

Rating

evaluate  (4.8 stars)

Upload time: 2024/11/23

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Product Details

Description



Features:

· Read Access Times of 120, 140, 150, 200, 250, 300ns
· JEDEC Approved Packages
    •32 pin, Hermetic Ceramic, 0.600" DIP (Package 300)
    •32 lead, Hermetic Ceramic, 0.400" SOJ (Package 101)
· Commercial, Industrial and Military Temperature Ranges
· MIL-STD-883 Compliant Devices Available
· Write Endurance 10,000 Cycles
· Data Retention at 25°C, 10 Years
· Low Power CMOS Operation
· Automatic Page Write Operation
    •Internal Address and Data Latches for 128 Bytes
    •Internal Control Timer
· Page Write Cycle Time 10ms Max.
· Data Polling for End of Write Detection
· Hardware and Software Data Protection
· TTL Compatible Inputs and Outputs



Pinout

  Connection Diagram


Specifications

Parameter
Symbol
Min
Max
Unit
Operating Temperature
TA
-55
+125
°C
Storage Temperature
TSTG
-65
+150
°C
Signal Voltage Relative to GND
VG
-0.6
+0.65
V
Voltage on OE and A9
-0.6
+13.5
V

NOTE:
Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.




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