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WE32K32-XXX

Features: • Access Times of 80**, 90, 120, 150ns• MIL-STD-883 Compliant Devices Available• Packaging:• 68 lead, Hermetic CQFP (G2U), 122.4mm (0.880 ) square, 3.56mm (0.140 ) height (Package 510).• 66-pin, PGA Type, 1.075 square, Hermetic Ceramic HIP (Package 400)* Th...

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SeekIC No. : 004545531 Detail

WE32K32-XXX: Features: • Access Times of 80**, 90, 120, 150ns• MIL-STD-883 Compliant Devices Available• Packaging:• 68 lead, Hermetic CQFP (G2U), 122.4mm (0.880 ) square, 3.56mm (0.140 ) ...

WE32K32-XXX Data Sheet

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Part Number:
WE32K32-XXX
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/12/21

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Product Details

Description



Features:

• Access Times of 80**, 90, 120, 150ns
• MIL-STD-883 Compliant Devices Available
• Packaging:
• 68 lead, Hermetic CQFP (G2U), 122.4mm (0.880") square, 3.56mm (0.140") height (Package 510).
• 66-pin, PGA Type, 1.075" square, Hermetic Ceramic HIP (Package 400)
* This product is subject to change without notice.
** 80ns speed is not fully characterized and is subject to change or cancellation without notice.
`Data Retention at 25, 10 Years
`Write Endurance, 10,000 Cycles
`Organized as 32Kx32; User Confi gurable 64Kx16 or 128Kx8
`Commercial, Industrial and Military Temperature Ranges
`Automatic Page Write Operation
`Page Write Cycle Time: 10ms Max
`Data Polling for End of Write Detection
`Hardware and Software Data Protection
`TTL Compatible Inputs and Outputs
`5 Volt Power Supply
`Low Power CMOS, 10mA Standby Typical
`Built-in Decoupling Caps and Multiple Ground Pins for Low Noise Operation


Pinout

Connection Diagram


Specifications

Parameter
Symbol
Unit
Operating Temperature
TA
-55 to +125
Storage Temperature
TSTG
-65 to +150
Signal Voltage Relative to GND
VG
-0.6 to + 6.25
V
Voltage on OE# and A9
-0.6 to +13.5
V

NOTE:
Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specifi cation is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.




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