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TUSB2136

Features: • Fully compliant with the USB release 1.1 specification• Supports 1.5 and 12 Mbits/s USB data rates• Supports USB suspend/resume and remote wake-up operation• Integrated two-port hub with individual power management per port• Integrated 8052 microcontroller...

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SeekIC No. : 004533858 Detail

TUSB2136: Features: • Fully compliant with the USB release 1.1 specification• Supports 1.5 and 12 Mbits/s USB data rates• Supports USB suspend/resume and remote wake-up operation• Inte...

TUSB2136 Data Sheet

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Part Number:
TUSB2136
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

• Fully compliant with the USB release 1.1 specification
• Supports 1.5 and 12 Mbits/s USB data rates
• Supports USB suspend/resume and remote wake-up operation
• Integrated two-port hub with individual power management per port
• Integrated 8052 microcontroller with: 256 * 8 RAM for internal data 8K * 8 RAM code space available for downloadable firmware from host or I2C port. [1] 512 * 8 shared RAM used for data buffers and endpoint descriptor blocks (EDB) [2] Four 8052 GPIO ports, ports 0,1, 2 and 3 Master I2C controller for external slave device access Watchdog timer
• Operates from a 12-MHz crystal
• On-chip PLL generates 48 MHz
• Supports a total of 3 input and 3 output (interrupt, bulk) endpoints
• Power-down mode
• 64-pin TQFP package


Pinout

Connection Diagram


Specifications

Supply voltage, VCC . . .  . . . . . . . . . . . . . . . . . . . . . 0.5 V to 4 V
Input voltage, VI . . . . . . . . . . . . . . . . . . . . 0.5 V to VCC + 0.5 V
Output voltage, VO . . . . . . . . . . . . . . . . . . 0.5 V to VCC + 0.5 V
Input clamp current, IIK  . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA
Output clamp current, IOK . .  . . . . . . . . . . . . . . . . . . . . . ±20 mA
Storage temperature . . . . . . . . . . .  . . . . . . . . . . 65 to 150
† Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.


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