Features: · Makes designing TRAC circuits easier, production prototyping quicker· Reduces component count and manufacturing costs· Enables simple connection of a serial output EEPROM or other memory device to TRAC· Compatible with current and future TRAC devices· Automatic program loading at power...
TRAC-S2: Features: · Makes designing TRAC circuits easier, production prototyping quicker· Reduces component count and manufacturing costs· Enables simple connection of a serial output EEPROM or other memory...
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The TRAC-S2 Field Programmable Analog Devices offers an integrated path from signal processing problems to working silicon solutions - in minutes! The Totall Reconfigurable Analog Circuit is a highly flexible single chip solution to the signal processing problems found in many markets.
Introducing a Top-Down, Structured design discipline, TRAC-S2 enables rapid implementation, prototyping and product release. Rather than working at the component level, TRAC champions the Computational Approach, providing designers with benefits formerly associated only with programmable digital devices. TRAC-S2 brings a truly integrated Signal Processing problem solving process, offering a path to Custom Silicon for higher volume users.
TRAC devices have to be loaded with program data at power-up and run from a split 5V supply. By integrating the loading interface circuitry, voltage regulation, supply monitoring and thermal protection, the TRAC support circuit (TRAC-S2) further simplifies circuit integration and interface with memory devices.
An adjustable frequency oscillator clocks program data out of a serial output memory device and into any number of cascaded TRAC-S2. By monitoring the bit stream pattern, TRAC-S2 can sense when loading is complete and stop clocking automatically.
An adjustable 'rail-splitter' of TRAC-S2 generates the ground supply rail, and the supply monitoring function initiates program load on power-up, and after power failure or serious fluctuation. Thermal shutdown further protects the device against overheating.