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TPS704F

Features: • Detector for visible, fluorescent, and other disturbance light. TPS703(F): > 700nm TPS704(F): > 800nm• High sensitivity TPS703(F): ISC = 1.5A (typ.) TPS704(F): ISC = 0.9A (typ.)• High speed response: tr, tf = 100ns (typ.)• Wide half value angle: 1/2 = ±6...

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SeekIC No. : 004527250 Detail

TPS704F: Features: • Detector for visible, fluorescent, and other disturbance light. TPS703(F): > 700nm TPS704(F): > 800nm• High sensitivity TPS703(F): ISC = 1.5A (typ.) TPS704(F): ISC = ...

TPS704F Data Sheet

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Part Number:
TPS704F
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

• Detector for visible, fluorescent, and other disturbance light.
                            TPS703(F): > 700nm
                            TPS704(F): > 800nm
• High sensitivity TPS703(F): ISC = 1.5A (typ.)
                            TPS704(F): ISC = 0.9A (typ.)
• High speed response: tr, tf = 100ns (typ.)
• Wide half value angle: 1/2 = ±65° (typ.)
• TLN115A(F), etc. are available as high radiant power infrared LEDs.


Specifications

Characteristic
Symbol
Rating
Unit
Forward current
VR
20
V
Power dissipation
PD
150
mW
Forward current derating
(Ta > 25)		 TPS703(F)
IF /
−2.31
mA /
TPS704(F)
−4.3
Pulse forward current (Note 1) TPS703(F)
Topr
−30~80
TPS704(F)
−30~60
Operating temperature range TPS703(F)
Tstg
−40~90
TPS704(F)
−40~60
Soldering temperature･time
Tsol
260°C･3s
-
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).


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