TLRE53T(F)

Features: • Lead(Pb)-free products (lead: Sn-Ag-Cu)• 3mm package• InGaAℓP technology• All plastic mold• Transparent lens• Lineup: 6 colors (red, orange, yellow, pure yellow, green and pure green)• High intensity light emission• Excellent low cu...

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TLRE53T(F) Picture
SeekIC No. : 004522034 Detail

TLRE53T(F): Features: • Lead(Pb)-free products (lead: Sn-Ag-Cu)• 3mm package• InGaAℓP technology• All plastic mold• Transparent lens• Lineup: 6 colors (red, orange, yel...

floor Price/Ceiling Price

Part Number:
TLRE53T(F)
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Month Sales

268 Transactions

Rating

evaluate  (4.8 stars)

Upload time: 2024/12/25

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Product Details

Description



Features:

• Lead(Pb)-free products (lead: Sn-Ag-Cu)
• 3mm package
• InGaAℓP technology
• All plastic mold
• Transparent lens
• Lineup: 6 colors (red, orange, yellow, pure yellow, green and pure green)
• High intensity light emission
• Excellent low current light output
• Applications: message boards, security devices and dashboard displays



Specifications

Product Name
Forward Current
IF (mA)
Reverse Voltage
VR (V)
Power Dissipation
PD (mW)
Operating
Temperature
Topr ()
Storage
Temperature
Tstg ()
TLRE53T(F) 50 4 120 -40~100 -40~120
TLRME53T(F) 50 4 120
TLSE53T(F) 50 4 120
TLOE53T(F) 50 4 120
TLYE53T(F) 50 4 120
TLPYE53T(F) 50 4 120
TLGE53T(F) 50 4 120
TLFGE53T(F) 50 4 120
TLPGE53T(F) 50 4 120

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).




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