TLPYE62T

Features: • Lead(Pb)-free products (lead: Sn-Ag-Cu)• 3mm package• InGaAℓP technology• All plastic mold type• Transparent lens• Lineup: 6 colors (red, orange, yellow, pure yellow, green and pure green)• High intensity light emission• Excellent l...

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TLPYE62T Picture
SeekIC No. : 004521978 Detail

TLPYE62T: Features: • Lead(Pb)-free products (lead: Sn-Ag-Cu)• 3mm package• InGaAℓP technology• All plastic mold type• Transparent lens• Lineup: 6 colors (red, orange...

floor Price/Ceiling Price

Part Number:
TLPYE62T
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Month Sales

268 Transactions

Rating

evaluate  (4.8 stars)

Upload time: 2025/1/11

Payment Methods

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Product Details

Description



Features:

• Lead(Pb)-free products (lead: Sn-Ag-Cu)
• 3mm package
• InGaAℓP technology
• All plastic mold type
• Transparent lens
• Lineup: 6 colors (red, orange, yellow, pure yellow, green and pure green)
• High intensity light emission
• Excellent low current light output



Application

message boards, security devices and dashboard displays


Specifications

Product Name
Forward Current
IF (mA)
Reverse Voltage
VR(V)
Power Dissipation
PD(mW)
Operating
Temperature
Topr()
Storage
Temperature
Tstg()
TLRE62T(F)
50
4
120
-40~100
-40~120
TLRME62T(F)
50
4
120
TLSE62T(F)
50
4
120
TLOE62T(F)
50
4
120
TLYE62T(F)
50
4
120
TLPYE62T(F)
50
4
120
TLGE62T(F)
50
4
120
TLFGE62T(F)
50
4
120
TLPGE62T(F)
50
4
120

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).



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