TLPGU50T(F)

Features: ·Lead(Pb)-free products (lead: Sn-Ag-Cu)·3mm package ·InGaAP technology ·All plastic mold type ·Transparent lens·Line-up: 2 colors (green and pure green) ·High intensity light emission ·Excellent low current light output ·Applications: message boards, security devices and dashboard displ...

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TLPGU50T(F) Picture
SeekIC No. : 004521957 Detail

TLPGU50T(F): Features: ·Lead(Pb)-free products (lead: Sn-Ag-Cu)·3mm package ·InGaAP technology ·All plastic mold type ·Transparent lens·Line-up: 2 colors (green and pure green) ·High intensity light emission ·Ex...

floor Price/Ceiling Price

Part Number:
TLPGU50T(F)
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Month Sales

268 Transactions

Rating

evaluate  (4.8 stars)

Upload time: 2025/1/11

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Product Details

Description



Features:

·Lead(Pb)-free products (lead: Sn-Ag-Cu) 
·3mm package  
·InGaAP technology  
·All plastic mold type  
·Transparent lens 
·Line-up: 2 colors (green and pure green)  
·High intensity light emission  
·Excellent low current light output  
·Applications: message boards, security devices and dashboard displays



Specifications

Product Name
Forward urrent
IF(mA)
Reverse Voltage
VR(V)
Power Dissipation
PD(mW)
Operating
Temperature
Topr()

Storage
Temperature
Tstg()
TLFGU50T(F)
30
4
72
-40 ~100
-40 ~120
TLPGU50T(F)
30
4
72

Note: Using continuously under heavy loads (e.g. the application of high
          temperature/current/voltage and the significant change in temper
          ature, etc.) may cause this product to decrease in the reliability
          significantly even if  the operating conditions (i.e. operating 
          temperature/current/voltage,etc.) are within the absolute maximum ratings. 

          Please design the appropriate reliability upon reviewing the Toshiba
          Semiconductor Reliability Handbook ("Handling Precautions"/"Derating
          Concept and Methods") and individual reliability data (i.e. reliability treport
          and estimated failure rate, etc).



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