PHOTOCOUPLER DUAL 8-DIP
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Series: | - | Package / Case : | SO-20 | ||
Manufacturer: | Toshiba | Voltage - Isolation: | 2500Vrms | ||
Number of Channels: | 2, Unidirectional | Current - Output / Channel: | 16mA | ||
Data Rate: | 10MBd | Propagation Delay High - Low @ If: | 60ns @ 0 ~ 7.5mA | ||
Current - DC Forward (If): | 20mA | Input Type: | DC | ||
Output Type: | Open Collector | Mounting Type: | Through Hole | ||
Package / Case: | 8-DIP (0.300", 7.62mm) | Supplier Device Package: | 8-DIP |
Characteristic |
Symbol |
Rating |
Unit | |
LED | Forward current (each channel) |
IF |
20 |
mA |
Pulse forward current (each channel)* |
IFP |
30 |
mA | |
Reverse voltage (each channel) |
VR |
5 |
V | |
Detector | Output current (each channel) |
IO |
16 |
mA |
Output voltage (each channel) |
VO |
−0.5~7 |
V | |
Supply voltage (1 minute maximum) |
VCC |
7 |
V | |
Output collector power dissipation (each channel) |
PO |
40 |
mW | |
Operating temperature range |
Tstg |
−55~125 |
||
Storage temperature range |
Topr |
−40~85 |
||
Lead soldering temperature (10s)** |
Tsol |
260 |
||
Isolation voltage (AC, 1 min., R.H. 60%, Note 3) |
BVS |
2500 |
Vrms |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
* t 1 msec duration.
** 2mm below seating plane.
The TOSHIBA TLP2631 dual photocoupler consists of a pair of GaAℓAs light emitting diode and integrated high gain, high speed photodetector. This unit is 8-lead DIP.
The output of the detector circuit is an open collector, Schottky clamped transistor.
A Faraday shield integrated on the photodetector chip reduces the effects of capacitive coupling between the input LED emitter and the high gain stages of the detector. The TLP2631 provides an effective common mode transient immunity of 1000V / s.