TLGU53C(F)

Features: • Lead(Pb)-free products (lead: Sn-Ag-Cu)• 3mm package• InGaAℓP technology• All plastic mold typeTLGU53T(F), TLPGU53T(F) : Transparent lensTLGU53C(F), TLPGU53C(F) : Colored, transparent lensTLGU53D(F), TLPGU53D(F) : Colored, diffused lens• Colors: gree...

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TLGU53C(F) Picture
SeekIC No. : 004521191 Detail

TLGU53C(F): Features: • Lead(Pb)-free products (lead: Sn-Ag-Cu)• 3mm package• InGaAℓP technology• All plastic mold typeTLGU53T(F), TLPGU53T(F) : Transparent lensTLGU53C(F), TLPGU53...

floor Price/Ceiling Price

Part Number:
TLGU53C(F)
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Month Sales

268 Transactions

Rating

evaluate  (4.8 stars)

Upload time: 2025/1/11

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Product Details

Description



Features:

• Lead(Pb)-free products (lead: Sn-Ag-Cu)
• 3mm package
• InGaAℓP technology
• All plastic mold type
TLGU53T(F), TLPGU53T(F) : Transparent lens
TLGU53C(F), TLPGU53C(F) : Colored, transparent lens
TLGU53D(F), TLPGU53D(F) : Colored, diffused lens
• Colors: green, pure green
• High intensity light emission
• Excellent low current light output
• Fast response time, capable of pulse operation
• Applications: message signboard, safety equipment, indicator



Specifications

Product Name
Forward Current
IF (mA)
Reverse Voltage
VR (V)
Power Dissipation
PD (mW)
Operating
Temperature
Topr ()
Storage
Temperature
Tstg ()
TLGU53T(F)
30
4
72
−40~100
−40~120
TLGU53C(F)
30
4
72
TLGU53D(F)
30
4
72
TLPGU53T(F)
30
4
72
TLPGU53C(F)
30
4
72
TLPGU53D(F)
30
4
72

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).




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