TLFGE68DG

Features: • Lead(Pb)-free products (lead: Sn-Ag-Cu)• 3mm package wide viewing angle• Can be mounted on a PCB using an automatic insertion machine (please refer to mounting Precautions Using an Automatic Insertion Machine)• InGaAℓP• Emitted colors: red, yellow a...

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SeekIC No. : 004521097 Detail

TLFGE68DG: Features: • Lead(Pb)-free products (lead: Sn-Ag-Cu)• 3mm package wide viewing angle• Can be mounted on a PCB using an automatic insertion machine (please refer to mounting Precaut...

floor Price/Ceiling Price

Part Number:
TLFGE68DG
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Month Sales

268 Transactions

Rating

evaluate  (4.8 stars)

Upload time: 2024/9/27

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Product Details

Description



Features:

• Lead(Pb)-free products (lead: Sn-Ag-Cu)
• 3mm package wide viewing angle
• Can be mounted on a PCB using an automatic insertion machine 
   (please refer to mounting Precautions Using an Automatic Insertion Machine)
• InGaAℓP
• Emitted colors: red, yellow and green
• Colored, Diffusing lens



Application

Various types of information panels, indicators for amusement equipment and panel backlighting illumination sources


Specifications

Product Name
Forward Current
IF (mA)
Reverse Voltage
VR(V)
Power Dissipation
PD(mW)
Operating
Temperature
Topr()
Storage
Temperature
Tstg()
TLRME68DG(F)
50
4
120
-40~100
-40~120
TLYE68DG(F)
50
4
120
TLGE68DG(F)
50
4
120
TLFGE68DG(F)
50
4
120

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).



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