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TC7WZ246FK

Features: • High output drive : ±24 mA (min) at VCC = 3 V• Super high speed operation : tpd = 5.0 ns(max) at VCC = 5 V, 50 pF• Operation voltage range : VCC (opr) = 1.65~5.5 V• 5.5-V tolerant inputs• 5.5-V power down protection outputs• Matches the performance o...

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TC7WZ246FK: Features: • High output drive : ±24 mA (min) at VCC = 3 V• Super high speed operation : tpd = 5.0 ns(max) at VCC = 5 V, 50 pF• Operation voltage range : VCC (opr) = 1.65~5.5 V̶...

TC7WZ246FK Data Sheet

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Part Number:
TC7WZ246FK
Supply Ability:
5000

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  • 1~5000
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  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

• High output drive : ±24 mA (min) at VCC = 3 V
• Super high speed operation : tpd = 5.0 ns(max) at VCC = 5 V, 50 pF
• Operation voltage range : VCC (opr) = 1.65~5.5 V
• 5.5-V tolerant inputs
• 5.5-V power down protection outputs
• Matches the performance of TC74LCX series when operated at 3.3-V VCC


Pinout

Connection Diagram


Specifications

SYMBOL PARAMETER RATING UNIT
VCC Power supply range −0.5~6 V
VIN DC input voltage −0.5~6 V
VOUT DC switch voltage −0.5~6 V
IIK Input diode current −20 mA
IOK Output diode current -20 mA
IOUT DC output current ±50, +50(Note 1) mA
PD Power dissipation 300 (SM8)
200 (US8)		 mW
ICC DC VCC/ground current ±50 mA
Tstg Storage temperature 65 to +150
TL Lead temperature (10 s) 260

Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).




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