TC7WZ245FK

Features: • High output drive : ±24 mA (min) at VCC = 3 V• Super high speed operation : tpd = 5.0 ns(max) at VCC = 5 V, 50 pF• Operation voltage range : VCC (opr) = 1.65~5.5 V• 5.5-V tolerant inputs• 5.5-V power down protection outputs• Matches the performance o...

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SeekIC No. : 004515129 Detail

TC7WZ245FK: Features: • High output drive : ±24 mA (min) at VCC = 3 V• Super high speed operation : tpd = 5.0 ns(max) at VCC = 5 V, 50 pF• Operation voltage range : VCC (opr) = 1.65~5.5 V̶...

floor Price/Ceiling Price

Part Number:
TC7WZ245FK
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/1/12

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Product Details

Description



Features:

• High output drive : ±24 mA (min) at VCC = 3 V
• Super high speed operation : tpd = 5.0 ns(max) at VCC = 5 V, 50 pF
• Operation voltage range : VCC (opr) = 1.65~5.5 V
• 5.5-V tolerant inputs
• 5.5-V power down protection outputs
• Matches the performance of TC74LCX series when operated at 3.3-V VCC



Pinout

  Connection Diagram


Specifications

Characteristics
Symbol
Rating
Unit
Supply voltage range
VCC
−0.5~6
V
DC input voltage
VIN
−0.5~6
V
DC output voltage
VOUT
−0.5~6
V
Input diode current
IIK
−20
mA
Output diode current
IOK
−20
mA
DC output current
IOUT
±50
mA
DC VCC/ground current
ICC
±50
mW
Power dissipation
PD
300 (SM8)
200 (US8)
mW
Storage Temperature
Tstg
−65~150
Lead temperature (10 s)
TL
260
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and
          the significant change in temperature, etc.) may cause this product to decrease in the reliability
          significantly  even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are
          within the absolute maximumratings and the operating ranges.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability testreport and estimated failure rate, etc).


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