TC7WZ02FU

Features: • High output drive: ±24 mA (min) at VCC = 3 V• Super high speed operation: tpd = 2.4 ns (typ.) at VCC = 5 V, 50 pF• Operation voltage range: VCC (opr) = 1.65~5.5 V• 5.5-V tolerant inputs• 5.5-V power down protection outputs• Matches the performance of...

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SeekIC No. : 004515120 Detail

TC7WZ02FU: Features: • High output drive: ±24 mA (min) at VCC = 3 V• Super high speed operation: tpd = 2.4 ns (typ.) at VCC = 5 V, 50 pF• Operation voltage range: VCC (opr) = 1.65~5.5 V•...

floor Price/Ceiling Price

Part Number:
TC7WZ02FU
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/1/12

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Product Details

Description



Features:

• High output drive: ±24 mA (min) at VCC = 3 V
• Super high speed operation: tpd = 2.4 ns (typ.) at VCC = 5 V, 50 pF
• Operation voltage range: VCC (opr) = 1.65~5.5 V
• 5.5-V tolerant inputs
• 5.5-V power down protection outputs
• Matches the performance of TC74LCX series when operated at 3.3-V VCC



Pinout

  Connection Diagram


Specifications

Characteristics Symbol Rating Unit
Supply voltage range VCC −0.5~6 V
DC input voltage VIN −0.5~6 V
DC output voltage VOUT −0.5~6 V
Input diode current IIK -20 mA
Output diode current IOK ±20 mA
DC output current IOUT ±50 mA
DC VCC/ground current ICC ±50 mA
Power dissipation PD 300 (SM8)
200 (US8)
mW
Storage temperature Tstg -65~+150
Lead temperature (10s) TL 260

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).




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